Ключевые слова: HTS, YBCO, coated conductors, coatings, films epitaxial, defects columnar, pinning, nanodots, PLD process, Jc/B curves, REBCO, angular dependence, RABITS process, stacking fault, IBAD process, comparison, fabrication, thickness dependence, nanoscaled effects, nanorods, pinning force, MOD process, presentation, critical caracteristics, substrate Hastelloy
Li Y., Xiong X., Qiao Y., Xie Y., Selvamanickam V., Reeves J.L., Chen Y., Lenseth K.P., Schmidt R.M.
Ключевые слова: HTS, YBCO, coated conductors, long conductors, IBAD process, buffer layers, films epitaxial, fabrication, high rate process, template layers, homogeneity, presentation, length
Goyal A., Heatherly L., Martin P.M., Wee S.H.(wees@ornl.gov)
Ключевые слова: HTS, REBCO, RABITS process, PLD process, films epitaxial, coated conductors, Jc/B curves, angular dependence, fabrication, critical caracteristics
Arendt P.N., Foltyn S.R., Jia Q.X., Wang H., MacManus-Driscoll J.L., Civale L., Maiorov B., Serquis A., Zhang X.
Goyal A., Paranthaman M., Heatherly L., Martin P.M., Li J., Wee S.H.(wees@ornl.gov)
Furuse M., Nakagawa Y., Yamasaki H.(h.yamasaki@aist.go.jp), Kaiho K., Arai K.
Ключевые слова: FCL resistive, HTS, YBCO, films epitaxial, substrate sapphire, design parameters, economic analysis, experimental results, power equipment
Sohma M., Kondo W., Tsukada K., Mizuta S., Kumagai T., Manabe T., Kamiya K., Yamaguchi I.(i-yamaguchi@aist.go.jp)
Ключевые слова: HTS, YBCO, films epitaxial, substrate sapphire, buffer layers, MOD process, microstructure, fabrication
Nakamura T., Takeo M., Kiss T.(kiss@sc.kyushu-u.ac.jp), Inoue M., Imamura K., Koyanagi K., Shiohara Y.(shiohara@istec.or.jp)
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, defects, local distribution, current density, current distribution, measurement technique
Castano O., Pinol S.(salva@icmab.es)
Ключевые слова: HTS, YBCO, films epitaxial, TFA-MOD process, phase formation, fabrication
Ключевые слова: HTS, REBCO, films epitaxial, buffer layers, PLD process, substrate sapphire, microstructure, fabrication
Pomar A., Rousseau B.(benoit.rousseau@cnrs-orleans.fr), Canizares A., Veron E., Ramy-Ratiarison R., Blin A., Meneses D.D., Simon P., Berberich F., Graafsma H.
Ключевые слова: HTS, YBCO, chemical solution deposition, substrate LaAlO3, films epitaxial, measurement technique, thickness dependence, porosity
Foltyn S.R., Jia Q.X., Wang H., Civale L., Maiorov B., Serquis A., Maley M.P., Peterson D.E., Lin Y., Hawley M.E., MacManus-Driscoll J.L.(jld35@cam.ac.uk)
Ключевые слова: patents, films epitaxial, fabrication, substrate single crystal, substrates, buffer layers, HTS, YBCO, films thick
Worz B.(bwoerz@web.de), Heinrich A., Stritzker B.
Ключевые слова: HTS, YBCO, coated conductors, substrate Ni-W, RABITS process, buffer layers, films epitaxial, surface oxidation, oxygen diffusion, microstructure, fabrication
Yamasaki H., Nakagawa Y., Obara H., Nie J.C.(jcnie@bnu.edu.cn), Develos-Bagarinao K., Murugesan M., Mawatari Y.
Ключевые слова: HTS, YBCO, films thick, films epitaxial, substrate single crystal, buffer layers, PLD process, microstructure, Jc/B curves, critical caracteristics, fabrication
Takahashi T., Yoshizawa M., Harada Y.(yharada@luck.ocn.ne.jp), Udsuka M., Nakanishi Y.
Yoshida Y., Osamura K., Matsumoto K., Horii S., Mukaida M., Ichinose A., Takahara D.(takahara@hightc.mtl.kyoto-u.ac.jp), Horide T.(horide@hightc.mtl.kyoto-u.ac.jp)
Ключевые слова: HTS, PLD process, substrate SrTiO3, coated conductors, films epitaxial, microstructure, Jc/B curves, critical caracteristics, fabrication
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